Work

Classification method for defect images based on association and clustering

Year: 2003

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.486007

Authors: Iivari Kunttu, Leena Lepisto, Juhani Rauhamaa, Ari J. Visa

Institutions: Tampere University of Technology, ABB (Finland)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2160354598

FWCI:

Cites: 20

Cited by: 4

Related to: 10