Work

In Situ Silicon-Integrated Tuner for Automated On-Wafer MMW Noise Parameters Extraction Using Multi-Impedance Method for Transistor Characterization

Year: 2011

Type: article

Source: IEEE Transactions on Semiconductor Manufacturing

DOI: 10.1109/tsm.2011.2181673

Authors: Yoann Tagro, Nicolas Waldhoff, Daniel Gloria, Samuel Boret, Gilles Dambrine

Institutions: STMicroelectronics (France), Institut d'Electronique, de Microélectronique et de Nanotechnologie

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Agence Nationale de la Recherche

Award: Centre expérimental pour l'étude des propriétés des nanodispositifs dans un large spectre du DC au moyen Infra-rouge.

OpenAlex ID: W2162391887

FWCI: 0.635

Cites: 7

Cited by: 8

Related to: 10