Work

Secondary Ion Mass Spectrometer with Liquid Metal Field Ion Source and Quadrupole Mass Analyzer

Year: 1986

Type: book-chapter

Source: Springer series in chemical physics

DOI: 10.1007/978-3-642-82724-2_33

Authors: J. M. Schroeer, J. Puretz

Institution: Illinois State University

Language: English

Topic: Ion-surface interactions and analysis

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2163109448

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Cites: 4

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Related to: 10