Work

Measurement of optical cavity properties in semiconductor lasers by Fourier analysis of the emission spectrum

Year: 1998

Type: article

Source: IEEE Journal of Quantum Electronics

DOI: 10.1109/3.720227

Authors: D. Hofstetter, R.L. Thornton

Institution: Palo Alto Research Center

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2165073201

FWCI: 2.328

Cites: 28

Cited by: 48

Related to: 10