Work

Studies of Second Breakdown in Silicon Diodes

Year: 1977

Type: article

Source: IEEE Transactions on Parts Hybrids and Packaging

DOI: 10.1109/tphp.1977.1135224

Author: A. Ward

Institution: Harry Diamond Laboratories

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2167047375

FWCI: 0.635

Cites: 12

Cited by: 9

Related to: 10