Work

A Table-Based Approach to Study the Impact of Process Variations on FinFET Circuit Performance

Year: 2010

Type: article

Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

DOI: 10.1109/tcad.2010.2042899

Authors: Rajesh A. Thakker, Chaitanya Sathe, Maryam Shojaei Baghini, Mahesh B. Patil

Institutions: Indian Institute of Technology Bombay, University of Illinois Urbana-Champaign

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Synopsys

OpenAlex ID: W2168055419

FWCI: 0.757

Cites: 19

Cited by: 14

Related to: 10