Work

Parallel double error correcting code design to mitigate multi-bit upsets in SRAMs

Year: 2008

Type: conference-paper

Source: European Solid-State Circuits Conference (ESSCIRC)

DOI: 10.1109/esscirc.2008.4681832

Authors: Riaz Naseer, Jeff Draper

Institution: University of Southern California

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Division of Electrical, Communications and Cyber Systems

OpenAlex ID: W2168133003

FWCI: 8.408

Cites: 13

Cited by: 142

Related to: 10