Work

Single event effects on hard-by-design latches

Year: 2007

Type: conference-paper

Source: European Conference on Radiation and Its Effects on Components and Systems

DOI: 10.1109/radecs.2007.5205498

Authors: Liang Wang, Yuhong Li, Suge Yue, Yuanfu Zhao, Long Fan, Liquan Liu

Institution: Beijing Microelectronics Technology Institute

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2170488665

FWCI:

Cites: 8

Cited by: 4

Related to: 10