Work

An age-aware library for reliability simulation of digital ICs

Year: 2013

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2013.6531973

Authors: M. Katoozi, E. H. Cannon, Tuan Dao, K. Aitken, S. Fischer, T. Amort, R. Brees, J. Tostenrude

Institution: Boeing (United States)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: U.S. Department of Defense, Defense Advanced Research Projects Agency

OpenAlex ID: W2172010397

FWCI: 0.812

Cites: 8

Cited by: 6

Related to: 10