Work

Minor and trace element analysis of natural zircon (ZrSiO4) by SIMS and laser ablation ICPMS : A consideration and comparison of two broadly competitive techniques

Year: 1998

Type: article

Source: Journal of Trace and Microprobe Techniques

Author: P. W. O. Hoskin

Language: English

Topic: Geological and Geochemical Analysis

Subfield: Geophysics

Field: Earth and Planetary Sciences

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2176705804

FWCI: 4.153

Cites:

Cited by: 84

Related to: 10