Work

An ellipsometric method for determining the optical parameters of thin-film coatings with a complex structure

Year: 2015

Type: article

Source: Optics and Spectroscopy

DOI: 10.1134/s0030400x15080238

Authors: A. A. Tikhii, V. A. Gritskikh, S. V. Kara-Murza, N. V. Korchikova, Yu. M. Nikolaenko, V. V. Faraponov, I. V. Zhikharev

Institutions: National Academy of Sciences of Ukraine, Donetsk Institute for Physics and Engineering named after O.O. Galkin, University of Luhansk

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2184884075

FWCI: 0.48

Cites: 2

Cited by: 8

Related to: 10