Work

Investigation of Temperature Dependence on DC and Low-Frequency Noise Characteristics in Uniaxial Tensile Strained nMOSFETs

Year: 2011

Type: conference-paper

Source: International Conference on Solid State Devices and Materials (SSDM)

DOI: 10.7567/ssdm.2011.p-3-3

Authors: S. C. Tsai, S. L. Wu, J. F. Chen, S. J. Chang, C. Y. Chang, P. C. Huang, C. Y. Wu, M. S. Chen, Y. C. Cheng, O. Cheng

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2256239689

FWCI:

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