Work

Laser interferometric method for determining the carrier diffusion length in semiconductors

Year: 2015

Type: article

Source: Semiconductors

DOI: 10.1134/s1063782615090201

Authors: V. V. Manukhov, A. B. Fedortsov, A. S. Ivanov

Institutions: St Petersburg University, Saint Petersburg Mining University

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2276199846

FWCI:

Cites: 3

Cited by: 1

Related to: 10