Effect of semiconductor devices' output parasitic capacitance on zero-current clamping phenomenon in PWM-VSI drives
Year: 2015
Type: conference-paper
Authors: D.B Rathnayake, S.G Abeyratne
Institution: University of Peradeniya
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2280940802
