Work

Comparison of Residual Stress Measurements Using X-Ray Diffraction and PRISM - Electronic Speckle Pattern Interferometry and Hole-Drilling

Year: 2007

Type: conference-paper

Source: SAE technical papers on CD-ROM/SAE technical paper series

DOI: 10.4271/2007-01-0804

Authors: Theo Rickert, Robert Fix, Lasse Suominen

Institution: Stresstech (Finland)

Language: English

Topic: Surface Treatment and Residual Stress

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2290885666

FWCI: 1.272

Cites: 3

Cited by: 7

Related to: 10