Modeling Launch Vehicle Reliability Growth as Defect Elimination
Year: 2010
Type: conference-paper
DOI: 10.2514/6.2010-8836
Authors: Elisabeth Morse, Joseph Fragola, Blake Putney
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2314014358
