Work

Key metrics for single-crystal two-dimensional X-ray area-detector systems

Year: 2012

Type: article

Source: Acta Crystallographica Section A Foundations of Crystallography

DOI: 10.1107/s0108767312097127

Authors: Z. Gál, A. Griffin, F. White, O. Presly, D. Kucharczyk, M. Meyer

Institution: Agilent Technologies (United Kingdom)

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2328313358

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