Work

Failure Analysis on Damaged GaAs HEMT MMIC Caused by Microwave Pulse

Year: 2014

Type: article

Source: IEEE Transactions on Electromagnetic Compatibility

DOI: 10.1109/temc.2014.2319815

Authors: Cunbo Zhang, Honggang Wang, Jiande Zhang, Guangxing Du, Jie Yang

Institution: National University of Defense Technology

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2332865660

FWCI: 1.24

Cites: 12

Cited by: 31

Related to: 10