Work

Capacitance Models Of Algan/Gan High Electron Mobility Transistors

Year: 2016
Type: article
Abstract: In this study, we report calculations of gate capacitance of AlGaN/GaN HEMTs with nextnano device simulation software. We have used a physical gate capacitance model for III-V FETs that incorporates quantum capacitance and centroid capacitance in the channel. These simulations explore various device structures with different values of barrier thickness and channel thickness. A detailed understanding of the impact of gate capacitance in HEMTs will allow us to determine their role in future 10 nm physical gate length node.
Language: English
Open Access status: green
OpenAlex ID: W2336734650
FWCI:
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Cited by: 3
Related to: 10