Work

Structural and Optical Characterization of Chemically Deposited PbS Thin Films

Year: 2016

Type: article

Source: Silicon

DOI: 10.1007/s12633-015-9399-z

Authors: A. N. Fouda, M. Marzook, H. M. Abd El-Khalek, S. Ahmed, E. A. Eid, A. B. El Basaty

Institutions: Suez Canal University, University of Ha'il, Suez University, Higher Technological Institute, Helwan University

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2337577366

FWCI: 1.001

Cites: 31

Cited by: 29

Related to: 10