Fail pattern classification and analysis system of memory fail bit maps
Year: 1999
Type: article
Source: 電子情報通信学会技術研究報告. ICD, 集積回路
Authors: Atsushi Ito, K. Nakamae, Hiroyuki Fujioka
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2340328286