Work

Carbon Nanotube Interconnects − A Promising Solution for VLSI Circuits

Year: 2016

Type: article

Source: IETE Journal of Education

DOI: 10.1080/09747338.2016.1158129

Authors: Mekala Girish Kumar, Yash Agrawal, Rajeevan Chandel

Institution: National Institute of Technology Hamirpur

Language: English

Topic: Copper Interconnects and Reliability

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2343552986

FWCI: 0.823

Cites: 122

Cited by: 34

Related to: 10