Year: 2015
Type: article
Abstract: This paper presents an improved feature extraction method to achieve a good performance in the detection of splicing forged images. Strong edges caused by the image splicing destroy the statistical dependencies between parent and child subbands in the wavelet domain. We analyze the co-occurrence probability matrix of parent and child subbands in the wavelet domain, and calculate the statistical moments from two-dimensional characteristic function of the co-occurrence matrix. The extracted features are used as the input of SVM classifier. Experimental results show that the proposed method obtains a good performance with a small number of features compared to the existing methods.
Authors: Tae-Hee Park, Yong-Ho Moon, Il-Kyu Eom
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W2371661882