Work

Current Measurement and Gate-Resistance Mismatch in Paralleled Phases of High Power SiC MOSFET Modules

Year: 2016

Type: article

Source: ERef Bayreuth (University of Bayreuth)

Authors: Roman Horff, Teresa Bertelshofer, Andreas Maerz, Mark‐M. Bakran

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2397843780

FWCI: 0.715

Cites:

Cited by: 5

Related to: 10