Measurement of charge transfer potential barrier in pinned photodiode CMOS image sensors
Year: 2016
Type: article
Source: Journal of Semiconductors
Authors: Chen Cao, Bing Zhang, Junfeng Wang, Longsheng Wu
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2399600341