20115 Stress analysis of low-k material interface during CMP
Year: 2006
Type: conference-paper
Authors: Yoshihiro Mochizuki, Hideki Shibata, Manabu Tsujimura, Hirokuni Hiyama
Institutions: Toshiba (Japan), Ebara (Japan)
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2401145489
