Work

The Performance of Magnetic Tunnel Junction Integrated on the Back-end Metal Line of CMOS Circuits

Year: 2009

Type: conference-paper

Source: International Conference on Solid State Devices and Materials (SSDM)

DOI: 10.7567/ssdm.2009.k-7-6

Authors: T. Endoh, F. Iga, S. Ikeda, K. Miura, J. Hayakawa, M. Kamiyanagi, H. Hasegawa, T. Hanyu, H. Ohno

Language: English

Topic: Magnetic properties of thin films

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2463061662

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