Work

Investigation of Micro-structural Change Using Raman Spectroscopy During Ni Silicide Mediated Crystallization of Amorphous Silicon

Year: 2003

Type: article

Source: Journal of the Korean Physical Society

Authors: Seong Jin Park, Jae Hwan Oh, Jin Jang, Sang Hoon Kang, Byeong Yeon Moon, Kyung Ho Kim, Woo Sung Sohn

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2467856071

FWCI:

Cites:

Cited by: 1

Related to: 10