Work

IR Thermography for Temperature Measurements and Fault Location on AlGaN/GaN HEMTs and MMICs

Year: 2015

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2015p0253

Authors: Lény Baczkowski, Franck Vouzelaud, Dominique Carisetti, Nicolas Sarazin, Jean-Claude Clément, Jean-Claude Jacquet, Christophe Gaquiére, Benoit Lambert, Laurent Brunel

Institutions: Thales (France), III V Lab, Institut d'Electronique, de Microélectronique et de Nanotechnologie, United Monolithic Semiconductors (Germany), United Monolithic Semiconductor (France)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2470933249

FWCI:

Cites:

Cited by: 1

Related to: 10