Work

SVM classification of thickness and lift-off using transient eddy current oscillation method

Year: 2016

Type: conference-paper

Source: IEEE International Instrumentation and Measurement Technology Conference

DOI: 10.1109/i2mtc.2016.7520428

Authors: Chandra S. Angani, Helena G. Ramos, Tiago J. Rocha, Artur L. Ribeiro

Institutions: Instituto de Telecomunicações, University of Lisbon

Language: English

Topic: Non-Destructive Testing Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Instituto de Telecomunicações

OpenAlex ID: W2487436637

FWCI: 1.663

Cites: 14

Cited by: 3

Related to: 10