Measurement of residual stresses in deposited films of SOFC component materials
Year: 1996
Type: report
Abstract: The stress induced in Solid oxide fuel cells (SOFC)s has important influence on the lifetime of SOFC. But the data on stress in SOFC and mechanical properties of SOW component materials have not been accumulated enough to manufacture SOFC. Especially, the data of La{sub 1-x}Sr{sub x}MnO{sub 3} cathode and La{sub 1-x}Sr{sub x}CrO{sub 3} interconnection have been extremely limited. We have estimated numerically the dependences of residual stress in SOFC on the material properties, the cell structure and the fabrication temperatures of the components, but these unknown factors have caused obstruction to simulate the accurate behavior of residual stress. Therefore, the residual stresses in deposited La{sub 1-x}Sr{sub x}MnO{sub 3} and La{sub 1-x}Sr{sub x}CrO{sub 3} films are researched by the observation of the bending behavior of the substrate strips. The films of SOFC component materials were prepared by the RF sputtering method, because: (1) It can fabricate dense films of poor sinterable material such as La{sub 1-x}Sr{sub x}CrO{sub 3} compared with sintering or plasma spray method. (2) For the complicated material such as perovskite materials, the difference between the composition of a film and that of a target material is generally small. (3) It can fabricate a thick ceramics film by improving of the deposition rate. For example, Al{sub 2}O{sub 3} thick films of 50{mu}m can be fabricated with the deposition rate of approximately 5{mu}m/h industrially. In this paper, the dependence of residual stress on the deposition conditions is defined and mechanical properties of these materials are estimated from the results of the experiments.
DOI: 10.2172/460186
Authors: T. Kato, A. Momma, S. Nagata, Y. Kasuga
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2490543301