Work

Accurate transient calorimetric measurement of soft-switching losses of 10kV SiC MOSFETs

Year: 2016

Type: conference-paper

Source: IEEE International Symposium on Power Electronics for Distributed Generation Systems (PEDG)

DOI: 10.1109/pedg.2016.7527030

Authors: Daniel Rothmund, Dominik Bortis, Johann W. Kolar

Institution: ETH Zurich

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W2491745353

FWCI: 11.63

Cites: 22

Cited by: 41

Related to: 10