X-ray Characterization of Thin Diamond Films Deposited by Hot-Filament Chemical Vapor Deposition
Year: 1990
Type: article
Source: Advances in X-ray Analysis
Authors: Richard F. Hamilton, Diwakar Garg, Keith A. Wood, David S. Hoover
Institution: Air Products (United States)
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2492477885
