Work

Modification of intrinsic defects in IZO/IGZO thin films for reliable bilayer thin film transistors

Year: 2016

Type: article

Source: RSC Advances

DOI: 10.1039/c6ra13208a

Authors: Nidhi Tiwari, Ram Narayan Chauhan, Po-Tsun Liu, Han-Ping D. Shieh

Institution: National Yang Ming Chiao Tung University

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2492861076

FWCI: 0.392

Cites: 22

Cited by: 27

Related to: 10