Work

Phonon-induced 1/f Noise in Mos Transistors

Year: 2001

Type: conference-paper

Source: International Conference on Noise in Physical Systems and 1/f Fluctuations (ICNF)

DOI: 10.1142/9789812811165_0038

Author: MIHAI N. MIHAILA

Institution: National Institute for Research and Development in Microtechnologies

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2494097938

FWCI: 0.863

Cites:

Cited by: 3

Related to: 10