Work

Study of Trap Distribution and Method of Neutralization in ITO/Poly-Si Junction

Year: 1987

Type: conference-paper

Source: Springer eBooks

DOI: 10.1007/978-94-009-3817-5_195

Authors: R. Ulman, S. Amirhaghi, M. Mudrik, N. Croitoru

Institution: Tel Aviv University

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2496034880

FWCI:

Cites: 5

Cited by:

Related to: 10