Work

VLSI circuit reliability under AC hot-carrier stress

Year: 1987

Type: conference-paper

Source: Symposium on VLSI Circuits

Authors: K. Nogami, K. Sawada, Masaaki Kinugawa, Takayasu Sakurai

Institution: Toshiba (Japan)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2517751069

FWCI: 2.433

Cites:

Cited by: 8

Related to: 10