Work

Latchup holding voltages and trigger currents in an SOI technology

Year: 2016

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2016.7574559

Authors: Guido Quax, Theo Smedes

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2524499232

FWCI: 0.93

Cites: 21

Cited by: 4

Related to: 10