Work

Optimization of PESD implant design for ESD robustness of 5V drain-back N-LDMOSFET

Year: 2016

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.2016.7574604

Authors: Chun Chiang, Ping-Chen Chang, Pei-Shan Tseng, Po-Ya Lai, Tien-Hao Tang, Kuan-Cheng Su

Institution: United Microelectronics (Taiwan)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2525568340

FWCI: 1.395

Cites: 12

Cited by: 3

Related to: 10