Work

Analysis of dynamic characteristic for ultra-thin coating layer with Ultrasonic Atomic Force Microscopy

Year: 2015

Type: conference-paper

Source: IEEE Far East NDT New Technology & Application Forum (FENDT)

DOI: 10.1109/fendt.2015.7398336

Authors: Dong Ryul Kwak, Seung Bum Cho, Ik Keun Park

Institution: Seoul National University of Science and Technology

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2532005153

FWCI:

Cites: 18

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Related to: 9