Work

FASTKIT—A Software Tool for Easy Design Visibility and Diagnostic Enhancement for Failure Analysis

Year: 2015

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2015p0349

Authors: Etienne Auvray, Paul Armagnat

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2533503170

FWCI: 0.416

Cites:

Cited by: 7

Related to: 10