Gate oxide protection and ggNMOSTs in 65 nm
Year: 2008
Type: article
Authors: Guido Notermans, Theo Smedes, Ž. Mrčarica, Peter J. de Jong, R. Stephan, Hans van Zwol, Dejan Maksimović
Institution: NXP (Netherlands)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2536622667