Work

A Teaching System Fostering Expertise for the Tuning of Printed Circuit Board Inspection Systems

Year: 2006

Type: conference-paper

Source: Annual Conference of the IEEE Industrial Electronics Society (IECON)

DOI: 10.1109/iecon.2006.347641

Authors: Hirotaka Wada, Akira Nakajima, Tetsuo Sawaragi, Yukio Horiguchi

Institutions: Omron (Japan), Kyoto University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Quality education, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2544532243

FWCI: 1.047

Cites: 3

Cited by: 2

Related to: 10