Work

The Role of Free Carrier Absorption in LADA

Year: 2014

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2014p0073

Authors: Kent Erington, Dan Bodoh, Kris Dickson, George Lange

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2547387751

FWCI: 0.401

Cites:

Cited by: 4

Related to: 10