Evaluating the Effect of SMT Material & Process Variables on Voiding Under QFNs
Year: 2016
Type: conference-paper
Source: IMAPSource Proceedings
Authors: Brandon Judd, Maria Durham
Institution: Indium Corporation (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2558355271
