Work

Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam

Year: 2016

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2016.2636871

Authors: Yaqing Chi, Ruiqiang Song, Shuting Shi, Biwei Liu, Li Cai, Chunmei Hu, Gang Guo

Institutions: National University of Defense Technology, China Institute of Atomic Energy

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Natural Science Foundation of Hunan Province

Award: G8965186738

OpenAlex ID: W2560434249

FWCI: 0.716

Cites: 17

Cited by: 20

Related to: 10