Work

Emulation-based fault analysis on RFID tags for robustness and security evaluation

Year: 2016

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/j.microrel.2016.12.008

Authors: Ibrahim Mezzah, Hamimi Chemali, Omar Kermia

Institutions: University Ferhat Abbas of Setif, Centre de Développement des Technologies Avancées

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2567547590

FWCI:

Cites: 25

Cited by: 6

Related to: 10