Approach to the clustering modeling for the strong correlative control measurements for estimation of percent of the suitable integrated circuits in the semiconductor industry
Year: 2016
Type: conference-paper
Authors: Ivan A. Ershov, Oleg Stukach
Institution: Tomsk Polytechnic University
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2575468267
