Work

New algorithm for improvement of sizing accuracy of defect depth in MFL type nondestructive testing

Year: 2016

Type: conference-paper

Source: Digest of the Fifth Biennial IEEE Conference on Electromagnetic Field Computation

DOI: 10.1109/cefc.2016.7816028

Authors: Hui Min Kim, Sang Hyeon Im, Ha Jeong Lee, Gwan Soo Park

Institution: Pusan National University

Language: English

Topic: Non-Destructive Testing Techniques

Subfield: Mechanical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2577089618

FWCI: 0.832

Cites: 2

Cited by: 1

Related to: 10