Work

Performance Analysis of Wavy FinFET and Optimization for Leakage Reduction

Year: 2016

Type: conference-paper

Source: IEEE International Symposium on Nanoelectronic and Information Systems (iNIS)

DOI: 10.1109/inis.2016.030

Authors: C. Anju, Nisha Kuruvilla, T.E. Ayoob Khan, T.A. Shahul Hameed

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2581111347

FWCI: 0.464

Cites: 11

Cited by: 1

Related to: 10